Date : 10/17/2022 7:04:35 AM
From : "Wiley"
To : nadavl@nrcn.gov.il
Subject : Optimize Compositional Analysis on the Scanning Electron Microscope

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EDS (Energy Dispersive Spectrometry) and WDS (Wavelength Dispersive Spectrometry) are two techniques that utilize the X-ray signal generated when a solid sample is bombarded with an electron beam - e.g. in a Scanning Electron Microscope (SEM). This webinar discusses the advantages and limitations of both techniques and showcases the latest developments in the AZtecWave software. Combined WDS-EDS automation and mapping enables EDS and WDS data to be optimally acquired and successfully combined to investigate diffusion profiles and other spatial variations in major-trace element composition.
 
 

 Key learnings

  • How elemental mapping with WDS can be used to accurately determine spatial  variations in trace elements or those effected by X-ray peak overlaps in the EDS spectrum
  • How the automation of quantitative WDS and/or EDS analysis from lines of points can be used to investigate diffusion profiles
  • How to work effectively by automating the collection of WDS and/or EDS data from individual points or lines of points
 

Speaker

 
Dr. Rosie Jones, Product Manager (WDS), Oxford Instruments NanoAnalysis
Dr. Rosie Jones graduated with a BSc and MSc in GeoSciences and Geochemistry from the University of Leeds, and a PhD in Geology from the University of Edinburgh. She joined Oxford Instruments in 2019 after completing a Postdoctoral Research position at the University of Oxford. Rosie has always worked with a strong focus on (micro)analytical techniques, including SEM-EDS, EPMA-WDS, XRF and mass spectrometry. She is currently Product Manager for WDS and works within the X-Ray Products Team.
 
Dr. Lucia Spasevski, Product Scientist, Oxford Instruments NanoAnalysis
Dr. Lucia Spasevski graduated with a BSc and MSc in Chemistry. She started her career as a Sales and Application specialist for a SEM distributor in Croatia.  In 2016, she joined the Semiconductor Spectroscopy and Devices group at Strathclyde University, Glasgow, where she obtained a PhD in Physics, using different microscopy techniques such as EPMA and CL. She joined Oxford Instruments in July 2021 as a Product Scientist, where she focusses on developing analytical approaches that solve key problems in the semiconductor industry.
 
This virtual seminar has been made possible through sponsorship from Oxford Instruments NanoAnalysis. Brought to you by Wiley Analytical Science.
 
 
 
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